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Highly Accelerated Stress Test Chamber(HAST Chamber)

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Highly Accelerated Stress Test Chamber(HAST Chamber)

Highly Accelerated Stress Test Chamber(HAST Chamber)

Description

HAST Test Chamber is suitable for the semiconductor chip industry, as well as electronic components, parts, integrated circuits, materials, and processes in fields such as aviation, aerospace, weapons, ships, nuclear industry, scientific research institutions, and universities. It confirms whether functional failure occurs due to durability (life) or environmental changes through accelerated high-temperature, high-humidity, high-pressure cycling and constant testing.

Prooduct Name Highly Accelerated Stress Test Chamber(HAST Chamber)
Prooduct Model HPSC251-M HPSC252-M
Working chamber volume 51L 51L×2 tanks
Working chamber dimensions φ380×D450(R×D) φ380×D450(R×D)×2 tanks
Tank Size φ450×D600(R×D) φ450×D600(R×D)×2 tanks
External dimensions 1200×1960×1140mm（W×H×D） 1200×2170×1140mm（W×H×D）
Temperature range 105℃～150℃
Temperature fluctuation ≤±0.5℃
Temperature uniformity ≤2℃
Temperature deviation ±2℃
Pressure Range 110kPa～300kPa(Absolute Pressure)

Mainly engaged in environmental test equipment, instrumentation and accessories design, manufacturing, sales, technical advice and maintenance services.

Information